适合什么需求Good Fit
沟槽、通孔、腔体、薄膜、梁、膜片、喷嘴、压力/惯性/声学/热学传感结构和小批量验证样品。Trenches, through holes, cavities, membranes, beams, nozzles and sensor prototype structures.
专业词入口Topic Entry
硅沟槽、通孔、薄膜、悬臂梁、腔体和传感结构,往往会跨越光刻、DRIE/ICP、镀膜、退火、键合、切割和封装。越早说明结构用途和交付状态,越容易判断路线。MEMS features often span lithography, DRIE/ICP, films, anneal, bonding, dicing and packaging.
沟槽、通孔、腔体、薄膜、梁、膜片、喷嘴、压力/惯性/声学/热学传感结构和小批量验证样品。Trenches, through holes, cavities, membranes, beams, nozzles and sensor prototype structures.
GDS/DXF、结构尺寸、目标深度、深宽比、材料栈、片厚片径、正背面工艺、释放方式、数量和验收方式。GDS/DXF, dimensions, depth, aspect ratio, stack, wafer size, front/backside process, release, quantity and acceptance.
深刻蚀侧壁波纹、残留、薄膜应力、释放粘连、晶圆翘曲、键合颗粒、切割崩边和测试夹具不匹配。Scalloping, residue, film stress, stiction, wafer bow, bonding particles, dicing chips and fixture mismatch.
推荐下一步Next Step
微纳Hub 会先判断是硅深刻蚀、表面微加工、体硅加工、键合封装,还是需要先做工艺窗口验证。若项目涉及流体、电学或力学测试,请把装夹和测试条件一起说明。MN Fab Hub can route silicon bulk micromachining, surface micromachining, bonding, packaging or process-window validation.
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