适合什么需求Good For
粉末和块体物相鉴定、薄膜结晶与择优取向、退火前后结构比较，以及晶圆或沉积样品的工艺验证。Phase identification, film crystallinity and texture, annealing comparisons and process validation.
专业词入口Topic Entry
XRD 测试，先区分块体、粉末与薄膜，再确定扫描几何。XRD starts by separating bulk, powder and thin-film samples, then choosing the scan geometry.
X 射线衍射可用于物相识别、晶体结构、择优取向和结晶变化判断。薄膜、微量样品与常规粉末的信号强度和基底干扰不同，需要提前约定常规 θ–2θ、掠入射或摇摆曲线等测试路线。XRD supports phase, structure, texture and crystallinity analysis, but films, powders and low-volume samples require different geometries and controls.
需要准备什么Prepare First
材料与可能物相、样品尺寸和厚度、基底、膜厚、扫描范围与步长、测试几何、对照样，以及原始数据和检索报告要求。Candidate phases, sample geometry, substrate, film thickness, scan range, step, geometry, controls and raw-data needs.
常见风险Common Risks
薄膜信号被基底淹没、样品高度偏差造成峰位漂移、峰重叠导致误判、扫描时间不足，以及把数据库匹配直接当成唯一物相结论。Substrate dominance, height-induced peak shifts, overlaps, insufficient scan time and overconfident database matching.
推荐下一步Next Step
把“做个 XRD”变成样品—几何—目标峰的测试矩阵。Turn “run XRD” into a sample, geometry and target-peak matrix.
请提交材料体系、样品照片与尺寸、基底和膜厚、预期物相或目标峰、对照样及扫描范围。微纳Hub 会先判断常规 XRD、GIXRD 或其他表征是否更合适，并明确原始谱与分析交付。Share the material, geometry, substrate, film thickness, candidate phases, controls and scan range so conventional XRD, GIXRD or complementary tests can be selected.
提交 XRD 测试需求Submit XRD request查看表征与测试导航Open metrology route