适合什么需求Good For
- 硅、石英、氮化硅、二氧化钛、金属或聚合物刻蚀Etching silicon, quartz, SiN, TiO2, metals or polymers
- RIE、ICP、DRIE、湿法腐蚀和释放结构RIE, ICP, DRIE, wet etch and release structures
- 需要控制深度、侧壁、选择比和残留的项目Projects requiring depth, sidewall, selectivity and residue control
工艺小站 02Process Stop 02
适合干法刻蚀、湿法刻蚀、深硅刻蚀、释放结构和侧壁形貌优化。For dry etch, wet etch, DRIE, release structures and sidewall-profile optimization.
把这些说清楚,别人就不用隔空猜样品;报价和可行性也会靠谱很多。When these points are clear, nobody has to guess the sample from thin air; feasibility and quotes get much more reliable.
1. 项目目标:想做什么结构,用于什么测试或验证。1. Project goal: target structure and intended test or validation.
2. 材料与样品:衬底、膜层、尺寸、数量、来源和特殊处理限制。2. Material and sample: substrate, films, size, quantity, source and handling limits.
3. 版图与尺寸:GDS/截图、最小线宽/线距、面积、Layer/Cell 和对准要求。3. Layout and dimensions: GDS/screenshots, CD/space, area, Layer/Cell and alignment.
4. 工艺与验收:目标深度/膜厚、误差、检测方式、交付形式和期望时间。4. Process and acceptance: depth/thickness, tolerance, metrology, deliverables and schedule.