工艺小站 02Process Stop 02

刻蚀与图形转移Etch & Pattern Transfer

适合干法刻蚀、湿法刻蚀、深硅刻蚀、释放结构和侧壁形貌优化。For dry etch, wet etch, DRIE, release structures and sidewall-profile optimization.

适合什么需求Good For

  • 硅、石英、氮化硅、二氧化钛、金属或聚合物刻蚀Etching silicon, quartz, SiN, TiO2, metals or polymers
  • RIE、ICP、DRIE、湿法腐蚀和释放结构RIE, ICP, DRIE, wet etch and release structures
  • 需要控制深度、侧壁、选择比和残留的项目Projects requiring depth, sidewall, selectivity and residue control

先准备什么Prepare First

  • 材料体系和膜层厚度Material stack and film thickness
  • 目标刻蚀深度、是否过刻、容差要求Target etch depth, over-etch and tolerance
  • 掩膜材料、光刻胶厚度和选择比预期Mask material, resist thickness and selectivity expectation
  • 截面 SEM、表面形貌或验收图片要求Cross-section SEM, morphology or acceptance-image needs

通常会找谁Who Usually Helps

  • ICP/RIE/DRIE 工艺平台ICP/RIE/DRIE platforms
  • 湿法刻蚀平台Wet etch platforms
  • MEMS 加工公司MEMS fabrication companies
  • 具备材料刻蚀窗口经验的工艺供应商Suppliers with material-specific etch windows

先把这些说清楚What to Spell Out

把这些说清楚,别人就不用隔空猜样品;报价和可行性也会靠谱很多。When these points are clear, nobody has to guess the sample from thin air; feasibility and quotes get much more reliable.

懒人邮件模板Quick Email Template

发送到 sunyvsheng@gmail.comEmail sunyvsheng@gmail.com 查看 RIE 反应离子刻蚀专项准备页Open RIE etching page 查看 ICP 刻蚀加工专项准备页Open ICP etching page 查看 ICP、RIE 与 DRIE 路线比较页Open ICP/RIE/DRIE comparison 查看 DRIE 深硅刻蚀专项准备页Open DRIE deep-silicon etch page 查看离子束刻蚀(IBE)加工准备页Open ion beam etching page 查看湿法刻蚀与湿法腐蚀准备页Open wet etching page